mass analyzed ion kinetic energy spectrometry
5.Abstract Epitaxial cerium dioxide thin films have been grown on Si (111) substrates by Mass-Analyzed Low Energy Dual ion Beam Deposition (IBD) Technique. The films are of 2000 A in thickness and good stoichiometry with homogeneous distribution of cerium and oxygen components. The measurements of X-ray double crystal diffraction show clear and sharp peaks of CeO2 (111) and (222) with FWHM≤23″.
9.Based on the revers kinetic intermediate energy heavy ion collision in which much more intermediate mass fragments are emitted towards forward angles, a sensitive observable on isospin effects in heavy ion collisions is investigated by means of using isospin dependent quantum molecular dynamics (IQMD).
