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1.Research of Sapphire Substrate CMP
蓝宝石衬底材料CMP抛光工艺研究收藏指正
2.Study of ECR-Plasma Cleaning and Nitridation of Sapphire Substrate by RHEED
蓝宝石衬底的ECR等离子体清洗与氮化的RHEED研究收藏指正
3.The cleaning and nitridation effect of hydrogen and nitrogen ECR plasma for sapphire substrate are studied by analyzing RHEED image. The results indicate that we can markedly improve the cleaning effect of sapphire substrate by adding a small amount of nitrogen into ECR hydrogen plasma,thereby we can obtain smooth and clear substrate surface.
通过分析 RHEED(反射高能电子衍射 )图像研究了 ECR(电子回旋共振 )等离子体所产生的活性氢源和氮源对蓝宝石衬底的清洗与氮化作用 ,结果表明 :在 ECR氢等离子体中掺入少量的氮气可以明显提高蓝宝石衬底的清洗效果 ,从而获得平整而洁净的衬底表面 ;收藏指正
4.AES and ESCA has been applied to the analysis of the superconducting Nb-Ge film which were deposited onto sapphire substrate by a low-energy sputtering technique.
利用表面分析仪器俄歇电子能谱(AES)仪和电子能谱化学分析(ESCA)仪对超导Nb-Ge溅射膜进行表面和深度剖面分析,以探讨在溅射沉积成膜过程中A15结构Nb_3Ge能够稳定生长的机制,以及影响其转变温度T_c的因素。收藏指正
5.The SiO_2 abradant is used to polish the sapphire substrate and the temperature,pH value,diameter of the abradant particle and its concentration during the polishing are analyzed. The results show that using the abradant of 80 nm diameter and high concentration can obtain both high polishing rate and good surface topography.
采用SiO2磨料对蓝宝石衬底片进行抛光,分析了抛光时的温度、pH条件、磨料粒径及浓度,结果表明,采用80 nm大粒径、高浓度的SiO2磨料,既可以保证抛光速率,又能得到良好的表面状态;收藏指正
6.Based on the relation images of RHEED for situ monitoring growth of GaN-based epitaxy film and surface feature epitaxy film. Details of transformation of the crystal lattice of growing surface of epitaxy film from RHEED images in different processes were given in this paper,such as hydrogen-nitrogen plasma cleaning,nitridation of sapphire substrate,growth of GaN buffer and AlN epilayer.
通过阐述外延薄膜进行原位监测的反射高能电子衍射(RHEED)以及RHEED图像的条纹或点阵与GaN基薄膜表面形貌的关系,提出了基于RHEED图像分析外延GaN基薄膜晶体结构演变情况,从衬底α-Al2O3的氢氮等离子体清洗、氮化、生长缓冲层以及生长外延层进行具体的分析、比较和演算。收藏指正
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